ʻO SiC Ceramic Tray End Effector Wafer e lawelawe ana i nā ʻāpana hana maʻamau
ʻO ka SiC Ceramic & Alumina Ceramic Custom Components Pōkole
ʻO Silicon Carbide (SiC) Nā Mea Kūʻai Kūʻai Ceramic
ʻO Silicon Carbide (SiC) nā mea hana seramika hana kiʻekiʻe i kaulana no ko lākouʻo ka paʻakikī kiʻekiʻe loa, ka paʻa wela maikaʻi loa, ka pale ʻana i ka corrosion, a me ka conductivity thermal kiʻekiʻe. Hiki i nā mea hana maʻamau ʻo Silicon Carbide (SiC) ke mālama i ka paʻa o ke kūkulu ʻananā kaiapuni wela kiʻekiʻe i ka wā e pale ana i ka ʻinoʻino mai nā ʻakika ikaika, alkalis, a me nā metala hehee. Hana ʻia nā seramika SiC ma o nā kaʻina hana e like mehoʻopaʻa paʻa ʻole, hoʻoheheʻe ʻana, a i ʻole ka hoʻopaʻa ʻana i ka wela-pressa hiki ke hoʻopilikino ʻia i loko o nā ʻano paʻakikī, e like me nā apo mechanical seal, shaft lima lima, nozzles, furnace tubes, wafer waʻa, a me nā papa lining-pale.
ʻO nā mea hana maʻamau Alumina Ceramic
Alumina (Al₂O₃).ka insulation kiʻekiʻe, ka ikaika mechanical maikaʻi, a me ke kū'ē kū'ē. Hoʻokaʻawale ʻia e nā māka maʻemaʻe (e laʻa, 95%, 99%), Alumina (Al₂O₃) nā mea hana seramika me ka mīkini pololei e hiki ai iā lākou ke hana ʻia i loko o nā insulators, bearings, ʻokiʻoki, a me nā implants olakino. Hana ʻia nā seramika alumina ma okaomi maloʻo, hoʻoheheʻe ʻia, a i ʻole nā hana kaomi isostatic, me nā ili hiki ke hoʻonani ʻia a hiki i ke aniani hoʻopau.
ʻO XKH kūikawā i ka R&D a me ka hana maʻamau osilika carbide (SiC) a me alumina (Al₂O₃) seramika. Ke nānā aku nei nā huahana ceramic SiC i nā kaiapuni kiʻekiʻe, ʻaʻahu kiʻekiʻe, a me ka corrosive, e uhi ana i nā noi semiconductor (e like me nā waʻa wafer, nā hoe cantilever, nā paipu umu) a me nā ʻāpana kahua wela a me nā sila kiʻekiʻe no nā māhele ikehu hou. Hoʻokumu nā huahana keramika alumina i ka insulation, sealing, a me nā waiwai biomedical, me nā substrates uila, nā apo mechanical seal, a me nā implants. Ke hoʻohana nei i nā ʻenehana e like meʻO ke kaomi isostatic, ka sintering ʻole, a me ka mīkini pololei, hāʻawi mākou i nā hoʻoponopono hoʻoponopono kiʻekiʻe no nā ʻoihana e pili ana i nā semiconductors, photovoltaics, aerospace, medical, and chemical processing, e hōʻoia ana i nā ʻāpana e hoʻokō i nā koi koʻikoʻi no ka pololei, ka lōʻihi, a me ka hilinaʻi i nā kūlana koʻikoʻi.
ʻO SiC Ceramic Functional Chucks & CMP Grinding Discs introduction
ʻO SiC nā ʻūhā ʻūhā ʻeleʻele
ʻO Silicon Carbide (SiC) Ceramic Vacuum Chucks nā mea hana adsorption kiʻekiʻe i hana ʻia mai nā mea hana kiʻekiʻe silicon carbide (SiC). Hoʻolālā ʻia lākou no nā noi e koi ana i ka maʻemaʻe a me ka paʻa, e like me ka semiconductor, photovoltaic, a me nā ʻoihana hana kikoʻī. ʻO kā lākou mau pōmaikaʻi nui, ʻo ia ka: kahi ʻili i hoʻoliʻi ʻia i ka aniani (ka palahalaha i loko o 0.3-0.5 μm), ʻoʻoleʻa kiʻekiʻe a me ka helu haʻahaʻa o ka hoʻonui wela (e hōʻoia ana i ke ʻano nano-level a me ke kūpaʻa kūlana), kahi ʻano māmā loa (e hoʻemi nui i ka neʻe inertia. ʻoi aku ka lōʻihi o ke ola o nā pahu metala) . Hiki i kēia mau waiwai ke hana paʻa i nā kaiapuni me ka hoʻololi ʻana i nā mahana kiʻekiʻe a me nā haʻahaʻa haʻahaʻa, ka ʻinoʻino ikaika, a me ka mālama ʻana i ka wikiwiki, e hoʻomaikaʻi nui i ka hoʻoili ʻana a me ka hana pono no nā mea kikoʻī e like me nā wafers a me nā mea optical.
ʻO Silicon Carbide (SiC) Bump Vacuum Chuck no ka Metrology a me ka nānā ʻana
Hoʻolālā ʻia no nā kaʻina nānā ʻana o ka wafer defect, ua hana ʻia kēia mea hana adsorption kiʻekiʻe mai ka silicon carbide (SiC) ceramic material. Hāʻawi kona ʻano hoʻoheheʻe kūʻokoʻa i ka ikaika adsorption vacuum i ka wā e hōʻemi ana i ka wahi hoʻopili me ka wafer, a laila e pale ai i ka pōʻino a i ʻole ka hoʻohaumia ʻana i ka ʻili wafer a me ka hōʻoia i ka paʻa a me ka pololei i ka wā o ka nānā ʻana. Hōʻike ka chuck i ka palahalaha maikaʻi loa (0.3-0.5 μm) a me kahi ʻili i hoʻoliʻi ʻia i ka aniani, i hui pū ʻia me ke kaumaha ultra-māmā a me ka ʻoʻoleʻa kiʻekiʻe e hōʻoia i ka paʻa i ka wā o ka neʻe wikiwiki. ʻO kāna coefficient haʻahaʻa haʻahaʻa o ka hoʻonui wela e hōʻoiaʻiʻo i ka paʻa o ka dimensional ma lalo o ka piʻi ʻana o ka mahana, ʻoiai ʻo ke kūpaʻa ʻana o ka lole e hoʻonui i ke ola lawelawe. Kākoʻo ka huahana i ka hoʻopilikino ʻana i nā kikoʻī 6, 8, a me 12-inihi e hoʻokō i nā pono nānā ʻana o nā nui wafer like ʻole.
ʻO ka Flip Chip Bonding Chuck
ʻO ka flip chip bonding chuck kahi mea nui i loko o nā kaʻina hana hoʻopaʻa chip flip-chip, i hoʻolālā ʻia no ka adsorbing wafers e hōʻoia i ka paʻa i ka wā kiʻekiʻe, nā hana hoʻopaʻa kiʻekiʻe. Hōʻike ia i kahi ʻili i hoʻoliʻi ʻia (flatness/parallelism ≤1 μm) a me nā ʻūhā kaila kinoea pololei e hoʻokō i ka ikaika adsorption vacuum like ʻole, e pale ana i ka neʻe ʻana a i ʻole ka pōʻino. ʻO kona koʻikoʻi kiʻekiʻe a me ka helu haʻahaʻa o ka hoʻonui wela (kokoke i ka mea silicon) e hōʻoia i ka paʻa o ka dimensional i nā wahi hoʻopaʻa wela kiʻekiʻe, ʻoiai nā mea kiʻekiʻe (e laʻa, silicon carbide a i ʻole nā ceramics kūikawā) e pale pono i ka permeation kinoea, e mālama ana i ka hilinaʻi ʻana i ka vacuum lōʻihi. Kākoʻo pū ʻia kēia mau hiʻohiʻona i ka pololei o ka hoʻopaʻa ʻana i ka micron-level a hoʻomaikaʻi nui i ka hua puʻupuʻu chip.
SiC Bonding Chuck
ʻO ka silicon carbide (SiC) bonding chuck he mea koʻikoʻi i nā kaʻina hana hoʻopili chip, i hoʻolālā ʻia no ka adsorbing a me ka hoʻopaʻa ʻana i nā wafers, e hōʻoia ana i ka hana ultra-stable ma lalo o nā kūlana hoʻopaʻa kiʻekiʻe a me ke kiʻekiʻe. Hana ʻia mai ke kiʻekiʻe kiʻekiʻe silicon carbide ceramic (porosity <0.1%), loaʻa ia i ka hāʻawi like ʻana o ka ikaika adsorption (deviation <5%) ma o ka nanometer-level mirror polishing (ka ʻili ʻili Ra <0.1 μm) a me ka pololei o ke kinoea channel grooves (pore diameters.) ʻO kona heluna haʻahaʻa haʻahaʻa o ka hoʻonui wela (4.5 × 10⁻⁶/℃) pili loa me nā wafer silika, e hōʻemi ana i ka warpage i hoʻoulu ʻia i ke kaumaha. Hoʻohui ʻia me ka ʻoʻoleʻa kiʻekiʻe (elastic modulus>400 GPa) a me ≤1 μm flatness/parallelism, e hōʻoiaʻiʻo i ka pololei o ka hoʻopili ʻana. Hoʻohana nui ʻia i ka pahu semiconductor, 3D stacking, a me Chiplet integration, kākoʻo ia i nā noi hana kiʻekiʻe e koi ana i ka pololei nanoscale a me ke kūpaʻa wela.
CMP Grinding Disc
ʻO ka CMP grinding disc he mea koʻikoʻi o nā mea hana chemical mechanical polishing (CMP), i hoʻolālā ʻia e paʻa a hoʻopaʻa paʻa i nā wafers i ka wā o ka polishing kiʻekiʻe, e hiki ai i ka nanometer-level global planarization. Hana ʻia mai nā mea kiʻekiʻe kiʻekiʻe, kiʻekiʻe kiʻekiʻe (e laʻa, silicon carbide ceramics a i ʻole nā mea hoʻohui kūikawā), e hōʻoiaʻiʻo i ka adsorption ʻokoʻa like ʻole ma o nā awāwa kinoea i hana pono ʻia. ʻO kona ʻili i hoʻoliʻi ʻia (flatness/parallelism ≤3 μm) e hōʻoiaʻiʻo i ka hoʻopili ʻole ʻana i ke kaumaha me nā wafers, aʻo kahi koena haʻahaʻa haʻahaʻa o ka hoʻonui ʻana i ka wela (kuʻi ʻia me ke silikoni) a me nā kahawai hoʻoluʻu kūloko e hoʻopau pono i ka deformation thermal. Hoʻohālikelike me nā wafers 12-inihi (750 mm anawaena), hoʻohana ka disc i ka ʻenehana hoʻopaʻa diffusion e hōʻoia i ka hoʻohui pono ʻana a me ka hilinaʻi lōʻihi o nā hale multilayer ma lalo o nā wela kiʻekiʻe a me nā puʻe, e hoʻonui nui i ka like ʻana o ke kaʻina CMP a me ka hua.
Hoʻokaʻawale ʻia nā ʻāpana ʻāpana SiC Ceramics ʻokoʻa
ʻO ke aniani kiʻi kiʻi kiʻi kiʻi (SiC).
ʻO ka Silicon Carbide (SiC) Square Mirror he mea kikoo kiʻekiʻe i hana ʻia mai ka silicon carbide ceramic kiʻekiʻe, i hoʻolālā ʻia no nā mea hana semiconductor kiʻekiʻe e like me nā mīkini lithography. Loaʻa iā ia ke kaumaha ultra-māmā a me ka ʻoʻoleʻa kiʻekiʻe (elastic modulus>400 GPa) ma o ka hoʻolālā hoʻolālā māmā māmā (e laʻa, ka hoʻoheheʻe ʻana i ka honeycomb ma hope), ʻoiai ʻo kāna mea hoʻonui haʻahaʻa haʻahaʻa haʻahaʻa (≈4.5 × 10⁻⁶/℃) e hōʻoia i ka hoʻopaʻa ʻana o ka mahana. ʻO ka ʻili aniani, ma hope o ka hoʻoliʻi pololei ʻana, loaʻa ka ≤1 μm flatness/parallelness, a me kona pale ʻana i ka lole ʻokoʻa (Mohs hardness 9.5) hoʻonui i ke ola lawelawe. Hoʻohana nui ʻia ia i nā keʻena hana mīkini lithography, nā mea hoʻonaninani laser, a me nā telescopes ākea kahi e koʻikoʻi ai ka pololei a me ke kūpaʻa.
ʻO nā alakaʻi alakaʻi hoʻolele lewa Silicon Carbide (SiC).
Hoʻohana ʻo Silicon Carbide (SiC) Air Floatation Guides i ka ʻenehana aerostatic bearing non-contact, kahi i hoʻokumu ʻia ai ke kinoea i hoʻopaʻa ʻia i kahi kiʻi ʻoniʻoni micron-level (maʻamau 3-20μm) e hoʻokō ai i ka neʻe ʻana o ka frictionless a me ka haʻalulu ʻole. Hāʻawi lākou i ka pololei o ka neʻe ʻana (ka pololei o ka hoʻonohonoho ʻana a hiki i ± 75nm) a me ka sub-micron geometric precision (straightness ± 0.1-0.5μm, flatness ≤1μm), i hoʻohana ʻia e ka mana hoʻopiʻi pani pani me nā unahi kikoʻī a i ʻole interferometer laser. ʻO ke kumu silicon carbide ceramic material (ʻo nā koho me Coresic® SP/Marvel Sic series) hāʻawi i ka ʻoʻoleʻa kiʻekiʻe (elastic modulus>400 GPa), ultra-low thermal expansion coefficient (4.0–4.5 × 10⁻⁶/K, pili i ke silikoni like ʻole). ʻO kāna hoʻolālā māmā (density 3.1g/cm³, ʻelua wale nō i ka alumini) e hōʻemi i ka neʻe inertia, ʻoiai ke kūpaʻa ʻokoʻa o ka lole (Mohs hardness 9.5) a me ka thermal stability e hōʻoia i ka hilinaʻi lōʻihi ma lalo o ka wikiwiki kiʻekiʻe (1m/s) a me nā kūlana kiʻekiʻe-wikiwiki (4G). Hoʻohana nui ʻia kēia mau alakaʻi i ka lithography semiconductor, nānā wafer, a me ka mīkini ultra-precision.
Nā Kukui Keʻa Silicon Carbide (SiC).
ʻO Silicon Carbide (SiC) Cross-Beams nā ʻāpana neʻe nui i hoʻolālā ʻia no nā lako semiconductor a me nā noi ʻoihana kiʻekiʻe, e hana nui ana e lawe i nā pae wafer a alakaʻi iā lākou ma nā alahele i kuhikuhi ʻia no ka wikiwiki kiʻekiʻe, ultra-precision motion. Ke hoʻohana nei i ka silicon carbide ceramic kiʻekiʻe (ʻo nā koho me Coresic® SP a i ʻole Marvel Sic series) a me ka hoʻolālā hoʻolālā māmā, loaʻa lākou i ke kaumaha ultra-māmā me ka ʻoʻoleʻa kiʻekiʻe (elastic modulus>400 GPa), a me kahi helu haʻahaʻa haʻahaʻa o ka hoʻonui wela (≈4.5 × 10/℃) <0.1%), e hōʻoia ana i ke kūpaʻa nanometric (flatness/parallelism ≤1μm) ma lalo o ke kaumaha wela a me ka mechanical. Kākoʻo kā lākou mau waiwai hoʻohui i nā hana kiʻekiʻe a me ka wikiwiki nui (e laʻa, 1m/s, 4G), e hoʻolilo iā lākou i mea kūpono no nā mīkini lithography, nā ʻōnaehana nānā wafer, a me ka hana kikoʻī, hoʻonui nui i ka pololei o ka neʻe a me ka maikaʻi o ka pane ʻana.
ʻO nā mea hoʻoneʻe Silicon Carbide (SiC).
ʻO ka Silicon Carbide (SiC) Motion Components nā ʻāpana koʻikoʻi i hoʻolālā ʻia no nā ʻōnaehana neʻe semiconductor kiʻekiʻe, me ka hoʻohana ʻana i nā mea SiC kiʻekiʻe kiʻekiʻe (e laʻa, Coresic® SP a i ʻole Marvel Sic series, porosity <0.1%) a me ka hoʻolālā hoʻolālā māmā e hoʻokō i ke kaumaha ultra-māmā me ka ʻoʻoleʻa kiʻekiʻe (elastic modulus >400). Me kahi helu haʻahaʻa haʻahaʻa o ka hoʻonui wela (≈4.5 × 10⁻⁶/℃), hōʻoia lākou i ke kūpaʻa nanometric (flatness/parallelism ≤1μm) ma lalo o nā loli wela. Kākoʻo kēia mau waiwai hoʻohui i nā hana kiʻekiʻe a me ka wikiwiki kiʻekiʻe (e laʻa, 1m/s, 4G), i mea kūpono no nā mīkini lithography, nā ʻōnaehana nānā wafer, a me ka hana pololei, e hoʻonui nui i ka pololei o ka neʻe a me ka maikaʻi o ka pane ʻana.
ʻO ka pāpaʻi ala ʻopika ʻo Silicon Carbide (SiC).
ʻO ka Silicon Carbide (SiC) Optical Path Plate kahi kahua kumu kumu i hoʻolālā ʻia no nā ʻōnaehana ʻelua-optical-alanui i nā lako nānā wafer. Hana ʻia mai ka silicon carbide ceramic kiʻekiʻe, loaʻa iā ia ka ultra-lightweight (density ≈3.1 g/cm³) a me ka ʻoʻoleʻa kiʻekiʻe (elastic modulus >400 GPa) ma o ka hoʻolālā ʻano māmā, ʻoiai e hōʻike ana i kahi helu ultra-haʻahaʻa (⁈0⁉⁉⁉⁶⁉⁄⁄. a me ke kiʻekiʻe kiʻekiʻe (porosity <0.1%), e hōʻoia ana i ke kūpaʻa nanometric (flatness/parallelism ≤0.02mm) ma lalo o ka wela a me ka mechanical fluctuations. Me kona nui kiʻekiʻe (900 × 900mm) a me ka hoʻokō ʻokoʻa ʻokoʻa, hāʻawi ia i kahi pae hoʻonohonoho paʻa paʻa lōʻihi no nā ʻōnaehana optical, hoʻonui nui i ka pololei o ka nānā ʻana a me ka hilinaʻi. Hoʻohana nui ʻia ia i ka semiconductor metrology, optical alignment, a me nā ʻōnaehana kiʻi kiʻekiʻe.
ʻO ke apo alakaʻi i uhi ʻia i ka Graphite + Tantalum Carbide
ʻO ka Graphite + Tantalum Carbide Coated Guide Ring he mea koʻikoʻi i hoʻolālā ʻia no nā lako ulu kristal hoʻokahi. ʻO kāna hana koʻikoʻi ke kuhikuhi pololei i ke kahe ʻana o ke kinoea kiʻekiʻe, e hōʻoiaʻiʻo ana i ka kūlike a me ka paʻa o ka mahana a me nā pā kahe i loko o ke keʻena pane. Hana ʻia mai ka substrate graphite maʻemaʻe kiʻekiʻe (ka maʻemaʻe> 99.99%) i uhi ʻia me kahi papa tantalum carbide (TaC) i hoʻopaʻa ʻia e CVD (ka uhi ʻana i ka maʻi haumia <5 ppm), hōʻike ia i ka conductivity thermal kūikawā (≈120 W/m·K) a me ka mahana wela a hiki i ka extremsness. 2200 ° C), pale pono i ka ʻino ʻana o ka mahu silika a me ka hoʻopaʻa ʻana i ka diffusion haumia. ʻO ke kūlike kiʻekiʻe o ka uhi (deviation <3%, ka uhi piha piha) e hōʻoia i ke alakaʻi ʻana i ke kinoea a me ka hilinaʻi lawelawe lōʻihi, e hoʻonui nui i ka maikaʻi a me ka hoʻoulu ʻana o ka ulu kristal hoʻokahi SiC.
ʻO ka ʻuala ʻo Silicon Carbide (SiC).
ʻO ka ʻiliahi ʻo Silicon Carbide (SiC).
ʻO ka Silicon Carbide (SiC) Vertical Furnace Tube kahi mea koʻikoʻi i hoʻolālā ʻia no nā ʻoihana ʻenehana kiʻekiʻe, e lawelawe nui ana ma ke ʻano he paipu pale waho e hōʻoia i ka hāʻawi ʻana i ka wela i loko o ka umu ma lalo o ka lewa lewa, me kahi mahana hana maʻamau ma kahi o 1200 ° C. Hana ʻia ma o ka paʻi 3D i hoʻohui ʻia i ka ʻenehana hana hoʻohui, hōʻike ia i kahi ʻano maʻiʻo haumia kumu <300 ppm, a hiki ke hoʻolako ʻia me kahi CVD silicon carbide coating (coating impurities <5 ppm). ʻO ka hui pū ʻana i ka conductivity thermal kiʻekiʻe (≈20 W/m·K) a me ke kūpaʻa haʻalulu ʻokoʻa (kū'ē i nā gradients thermal >800°C), hoʻohana nui ʻia i nā kaʻina wela kiʻekiʻe e like me ka mālama wela semiconductor, photovoltaic material sintering, a me ka precision ceramic production, e hoʻonui nui i ka like ʻana o ka wela a me ka lōʻihi.
Paipu Uhi Horizontal Silicon Carbide (SiC).
ʻO ka Silicon Carbide (SiC) Horizontal Furnace Tube kahi mea nui i hoʻolālā ʻia no nā kaʻina hana kiʻekiʻe, e lawelawe ana ma ke ʻano he paipu kaʻina hana i loko o nā lewa i loaʻa ka oxygen (reactive gas), nitrogen (protection gas), a me ka trace hydrogen chloride, me kahi mahana hana maʻamau ma kahi o 1250 ° C. Hana ʻia ma o ka paʻi 3D i hoʻohui ʻia i ka ʻenehana hana hoʻohui, hōʻike ia i kahi ʻano maʻiʻo haumia kumu <300 ppm, a hiki ke hoʻolako ʻia me kahi CVD silicon carbide coating (coating impurities <5 ppm). ʻO ka hoʻohui ʻana i ka conductivity thermal kiʻekiʻe (≈20 W/m·K) a me ke kūpaʻa haʻalulu ʻokoʻa (kū'ē i nā gradients thermal >800°C), kūpono ia no ke koi ʻana i nā noi semiconductor e like me ka oxidation, diffusion, a me ka hoʻopaʻa ʻana i nā kiʻiʻoniʻoni lahilahi, e hōʻoia ana i ka kūpaʻa o ke kūkulu ʻana, ka maʻemaʻe o ka ea, a me nā kūlana wela lōʻihi.
ʻO SiC Ceramic Fork Arms Introduction
Hana Hana Semiconductor
I ka hana ʻana i ka wafer semiconductor, ua hoʻohana mua ʻia nā lima lāʻau seramika SiC no ka hoʻololi ʻana a me ka hoʻonohonoho ʻana i nā wafers, ʻike pinepine ʻia ma:
- Lako Wafer Processing: E like me nā cassette wafer a me nā waʻa kaʻina hana, e hana paʻa ana i nā kaiapuni kiʻekiʻe-mehana a me ka corrosive.
- Nā Mīkini Lithography: Hoʻohana ʻia i nā ʻāpana kikoʻī e like me nā pae, nā alakaʻi, a me nā lima robotic, kahi e hōʻoia ai ko lākou rigidity kiʻekiʻe a me ka deformation thermal haʻahaʻa i ka pololei o ka pae nanometer.
- Nā Kaʻina Hana Etching a me ka Diffusion: Ke lawelawe nei ma ke ʻano he ICP etching trays a me nā ʻāpana no nā kaʻina diffusion semiconductor, ko lākou maʻemaʻe kiʻekiʻe a me ka pale ʻana i ka corrosion e pale i ka haumia i loko o nā keʻena kaʻina.
ʻOihana ʻOihana a me Robotics
He mea koʻikoʻi ʻo SiC ceramic fork arms i nā robots ʻoihana kiʻekiʻe a me nā mea hana automated.
- ʻO Robotic End Effectors: Hoʻohana ʻia no ka mālama ʻana, ka hui ʻana, a me ka hana pololei. ʻO kā lākou mau waiwai māmā (density ~ 3.21 g / cm³) e hoʻonui i ka wikiwiki a me ka maikaʻi o ka robot, ʻoiai ko lākou paʻakikī kiʻekiʻe (Vickers hardness ~2500) e hōʻoia i ka pale ʻana i ka lole.
- Nā Laina Hana Hana ʻAunoa: Ma nā hiʻohiʻona e koi ana i ke alapine kiʻekiʻe, ka hoʻokele pololei kiʻekiʻe (e laʻa, nā hale kūʻai e-commerce, hale mālama hale hana), hōʻoia nā lima lāʻau SiC i ka hana kūpaʻa lōʻihi.
Aerospace a me New Energy
Ma nā kaiapuni koʻikoʻi, hoʻohana nā lima lāʻau seramika SiC i ko lākou kūpaʻa wela kiʻekiʻe, kūpaʻa corrosion, a me ke kūpaʻa haʻalulu wela:
- Aerospace: Hoʻohana ʻia i nā mea koʻikoʻi o ka mokulele a me nā drones, kahi e kōkua ai kā lākou mau mea māmā a ikaika kiʻekiʻe e hōʻemi i ke kaumaha a hoʻonui i ka hana.
- ʻIke Hou: Hoʻohana ʻia i nā lako hana no ka ʻoihana photovoltaic (e laʻa, nā umu diffusion) a ma ke ʻano he ʻāpana hoʻonohonoho pololei i ka hana ʻana i ka pākaukau lithium-ion.

Ka Hana Hana Hana Kiekie
Hiki i nā lima fork ceramic SiC ke kū i nā mahana ma mua o 1600°C, e kūpono ana iā lākou no:
- Metallurgy, Ceramics, and Glass Industry: Hoʻohana ʻia i nā manipulators wela wela, nā papa hoʻonohonoho, a me nā pā pana.
- Nuclear Energy: Ma muli o ko lākou pale ʻana i ka radiation, kūpono lākou no kekahi mau ʻāpana i nā reactors nuklea.
Lako Lapaau
Ma ke kahua lapaʻau, hoʻohana mua ʻia nā lima lāʻau ceramic SiC no:
- Nā Lapaʻau Lapaʻau a me nā mea ʻokiʻoki: waiwai ʻia no ko lākou biocompatibility, pale ʻana i ka corrosion, a me ke kūpaʻa i nā wahi sterilization.
SiC Coating Overview
| Nā waiwai maʻamau | Units | Waiwai |
| Hoʻolālā |
| Māhele FCC β |
| Kūlana | Hakina (%) | 111 makemake |
| ʻAno nui | g/cm³ | 3.21 |
| ʻoʻoleʻa | ʻO ka paʻakikī o Vickers | 2500 |
| Kaha Wela | J·kg-1 ·K-1 | 640 |
| Hoʻonui wela 100–600 °C (212–1112 °F) | 10-6K-1 | 4.5 |
| ʻO Young's Modulus | Gpa (4pt piko, 1300 ℃) | 430 |
| Ka nui o ka palaoa | μm | 2~10 |
| Mahana Sublimation | ℃ | 2700 |
| Ikaika Pilikino | MPa (RT 4-point) | 415 |
| ʻO ke kau wela wela | (W/mK) | 300 |
ʻO nā ʻāpana hoʻolālā silikona karbide ceramic
SiC Seal Parts Overview
ʻO nā sila SiC kahi koho maikaʻi loa no nā kaiapuni koʻikoʻi (e like me ke kiʻekiʻe kiʻekiʻe, ke kaomi kiʻekiʻe, ka media corrosive, a me ke kapa kiʻekiʻe o ka wikiwiki) ma muli o ko lākou paʻakikī paʻakikī, kūpaʻa ʻaʻahu, kūpaʻa wela kiʻekiʻe (e kū ana i nā mahana a hiki i 1600 ° C a i ʻole 2000 ° C), a me ka pale ʻana i ka corrosion. ʻO kā lākou kiʻekiʻe thermal conductivity e hoʻomaʻamaʻa maikaʻi i ka hoʻoheheʻe ʻana i ka wela, ʻoiai ʻo kā lākou haʻahaʻa friction coefficient a me nā waiwai lubricating ponoʻī e hōʻoia hou i ka hilinaʻi sila a me ke ola lawelawe lōʻihi ma lalo o nā kūlana hana koʻikoʻi. Hoʻohana nui ʻia kēia mau hiʻohiʻona i nā sila SiC i nā ʻoihana e like me ka petrochemical, mining, semiconductor manufacturing, wastewater treatment, a me ka ikehu, e hōʻemi nui ana i nā kumukūʻai mālama, e hōʻemi ana i ka downtime, a me ka hoʻonui ʻana i ka pono o ka hana a me ka palekana.
Pōkole ʻo SiC Ceramic Plates
Kaulana ʻia nā pā seramika Silicon Carbide (SiC) no ko lākou ʻano paʻakikī (ʻo Mohs hardness a hiki i ka 9.5, kekona wale nō i ke daimana), ʻoi aku ka maikaʻi o ka thermal conductivity (ʻoi aku ma mua o ka hapa nui o nā ceramics no ka hoʻokele wela maikaʻi), a me ka inertness kemika a me ke kūpaʻa haʻalulu wela (me ka ikaika o ka waika, ka alkalis a me ka ikaika). ʻO kēia mau waiwai e hōʻoia i ka paʻa o ke kūkulu ʻana a me ka hana hilinaʻi i nā kaiapuni koʻikoʻi (e laʻa, ka wela kiʻekiʻe, abrasion, a me ka corrosion), ʻoiai e hoʻolōʻihi i ke ola lawelawe a me ka hōʻemi ʻana i nā pono mālama.
Hoʻohana nui ʻia nā papa seramika SiC i nā kula kiʻekiʻe:
• Nā Mea Hana Abrasive and Grinding: Leveraging ultra-high hardness no ka hana ʻana i nā huila wili a me nā mea hana polishing, e hoʻonui i ka pololei a me ka lōʻihi ma nā wahi abrasive.
•Nā Mea Hoʻomaʻamaʻa: E lawelawe ana ma ke ʻano he kapuahi a me nā ʻāpana kiln, e mālama ana i ke kūpaʻa ma luna o 1600°C no ka hoʻomaikaʻi ʻana i ka wela a hoʻemi i nā kumukūʻai mālama.
• ʻOihana Semiconductor: E hana ana ma ke ʻano he substrate no nā mea uila mana kiʻekiʻe (e laʻa, nā diodes mana a me nā mea hoʻonui RF), e kākoʻo ana i nā hana kiʻekiʻe a me ka wela kiʻekiʻe e hoʻoikaika i ka hilinaʻi a me ka pono o ka ikehu.
• Ka hoolei a me ka hoohehee: Hoololi i na mea kahiko i ka hana metala no ka hooiaio ana i ka maikai o ka wela a me ke ku'e ino kemika, hoonui i ka maikai o ka metala a me ke kumu kuai.
SiC Wafer Boat Abstract
Hāʻawi nā moku seramika XKH SiC i ke kūpaʻa wela kiʻekiʻe, ka inertness kemika, ka ʻenekinia pololei, a me ka hoʻokele waiwai, e hāʻawi ana i kahi hopena lawe kiʻekiʻe no ka hana semiconductor. Hoʻonui nui lākou i ka palekana o ka mālama ʻana i ka wafer, ka hoʻomaʻemaʻe, a me ka hana pono ʻana, e hana ana iā lākou i nā mea pono i ka hana wafer holomua.
Nā hoʻohana ʻana o nā moku seramika SiC:
Hoʻohana nui ʻia nā moku seramika SiC i nā kaʻina semiconductor mua, me:
• Nā Kaʻina Hana Hoʻomoe: E like me LPCVD (Low-Pressure Chemical Vapor Deposition) a me PECVD (Plasma-Enhanced Chemical Vapor Deposition).
• Nā Hana Kūlana Ki'eki'e
• Māmā & Hoʻomaʻemaʻe Kaʻina
He kūpono me nā kaʻina hana lewa a me ka ʻūhā,
He kūpono lākou no nā fabs e ʻimi nei e hōʻemi i nā pilikia o ka hoʻohaumia a hoʻomaikaʻi i ka hana hana.
Nā ʻāpana o ka Waʻa Wafer SiC:
| Nā Waiwai ʻenehana | ||||
| Papa kuhikuhi | Unite | Waiwai | ||
| Inoa Mea | ʻO ka hoʻoheheʻe Sintered Silicon Carbide | ʻO Silicon Carbide i hoʻopaʻa ʻole ʻia | ʻO Silicon Carbide i hana hou ʻia | |
| Huina | RBSiC | SSiC | R-SiC | |
| ʻAiʻi Nui | g/cm3 | 3 | 3.15 ± 0.03 | 2.60-2.70 |
| Ikaika Flexural | MPa (kpsi) | 338(49) | 380(55) | 80-90 (20°C) 90-100(1400°C) |
| Ka ikaika hoʻopili | MPa (kpsi) | 1120(158) | 3970(560) | > 600 |
| ʻoʻoleʻa | Knoop | 2700 | 2800 | / |
| Haʻihaʻi Paʻa | MPa m1/2 | 4.5 | 4 | / |
| ʻO ka hoʻoili wela | W/mk | 95 | 120 | 23 |
| Coefficient o ka hoonui wela | 10-6.1/°C | 5 | 4 | 4.7 |
| Wela Kūikawā | Joule/g 0k | 0.8 | 0.67 | / |
| Max wela i ka ea | ℃ | 1200 | 1500 | 1600 |
| Elastic Modulus | Gpa | 360 | 410 | 240 |
Hōʻike ʻia nā ʻāpana maʻamau ʻo SiC Ceramics
SiC Ceramic Membrane
ʻO ka membrane ceramic SiC kahi hopena kānana holomua i hana ʻia mai ka silicon carbide maʻemaʻe, e hōʻike ana i kahi ʻano ʻekolu-layer ikaika (ka papa kākoʻo, ka papa hoʻololi, a me ka membrane hoʻokaʻawale) i hana ʻia ma o nā kaʻina sintering kiʻekiʻe. Mālama kēia hoʻolālā i ka ikaika mechanical kūikawā, ka hāʻawi ʻana i ka nui o ka pore pololei, a me ka lōʻihi o ka lōʻihi. ʻOi maikaʻi ia i nā noi ʻoihana like ʻole ma o ka hoʻokaʻawale maikaʻi ʻana, ka noʻonoʻo ʻana, a me ka hoʻomaʻemaʻe ʻana i nā wai. ʻO nā mea nui e hoʻohana ʻia ai ka mālama ʻana i ka wai a me ka wai ʻino (ka wehe ʻana i nā mea paʻa paʻa, bacteria, a me nā mea hoʻohaumia kūlohelohe), ka hoʻoponopono ʻana i ka meaʻai a me ka mea inu (hoʻomaʻamaʻa ʻana a me ka noʻonoʻo ʻana i ka wai, waiu, a me nā wai fermented), nā lāʻau lapaʻau a me ka biotechnology (hoʻomaʻemaʻe i nā biofluids a me nā intermediates), ka hana kemika ( kānana ʻana i nā wai corrosive a me nā mea hoʻoheheʻe), a me ka ʻaila hoʻomaʻemaʻe.
Paipu SiC
ʻO nā paipu SiC (silicon carbide) nā ʻāpana seramika hana kiʻekiʻe i hoʻolālā ʻia no nā ʻōnaehana umu semiconductor, i hana ʻia mai ka silicon carbide maʻemaʻe maikaʻi loa ma o nā ʻenehana sintering kiʻekiʻe. Hōʻike lākou i ka conductivity thermal maikaʻi loa, ke kūpaʻa kiʻekiʻe-mehana (kū ʻole ma luna o 1600 ° C), a me ke kūpaʻa corrosion kemika. ʻO kā lākou mea hoʻonui haʻahaʻa haʻahaʻa haʻahaʻa a me ka ikaika mechanical kiʻekiʻe e hōʻoia i ka paʻa o ka dimensional ma lalo o ke kaʻa uila wela, e hōʻemi maikaʻi ana i ka deformation a me ka ʻaʻahu. Ua kūpono nā paipu SiC no nā umu diffusion, oxidation furnaces, a me nā ʻōnaehana LPCVD/PECVD, e ʻae ana i ka hāʻawi ʻana i ka mahana like ʻole a me nā kūlana hana paʻa e hōʻemi i nā hemahema wafer a hoʻomaikaʻi i ka homogeneity deposition kiʻiʻoniʻoni lahilahi. Hoʻohui ʻia, ʻo ke ʻano paʻa, ʻaʻole porous a me ka inertness kemika o SiC e pale aku i ka erosion mai nā kinoea reactive e like me ka oxygen, hydrogen, a me ka amonia, e hoʻolōʻihi i ke ola lawelawe a me ka hōʻoia ʻana i ka maʻemaʻe o ke kaʻina hana. Hiki ke hoʻopilikino ʻia nā paipu SiC i ka nui a me ka mānoanoa o ka paia, me ka mīkini pololei e hoʻokō ai i nā ʻili o loko maʻemaʻe a me ka concentricity kiʻekiʻe e kākoʻo i ke kahe laminar a me nā ʻaoʻao wela kaulike. ʻO nā koho polishing a i ʻole ka uhi ʻana e hōʻemi hou i ka hoʻokumu ʻana o nā ʻāpana a hoʻonui i ka pale ʻana i ka corrosion, e hoʻokō i nā koi koʻikoʻi o ka hana semiconductor no ka pololei a me ka hilinaʻi.
SiC Ceramic Cantilever hoe
ʻO ka hoʻolālā monolithic o SiC cantilever blades e hoʻonui nui i ka ikaika mechanical a me ka like ʻana o ka wela i ka wā e hoʻopau ana i nā hono a me nā wahi nāwaliwali maʻamau i nā mea hana. Hoʻopili pololei ʻia ko lākou ʻili a hiki i ka hoʻopau ʻana i ka aniani, e hōʻemi ana i ka hoʻokumu ʻana i nā ʻāpana a me ka hoʻokō ʻana i nā kūlana maʻemaʻe. ʻO ka inertia kemika kūlohelohe o SiC ka mea e pale ai i ka hoʻokuʻu ʻana, ka ʻino, a me ke kaʻina hana i nā kaiapuni reactive (e laʻa, oxygen, mahu), e hōʻoia ana i ka paʻa a me ka hilinaʻi i nā kaʻina diffusion/oxidation. ʻOiai ke kaʻa uila wela, mālama ʻo SiC i ka kūpaʻa o ke kūkulu ʻana, hoʻonui i ke ola lawelawe a me ka hōʻemi ʻana i ka wā mālama. ʻO ke ʻano māmā o SiC e hiki ai i ka pane wela ʻoi aku ka wikiwiki, ka wikiwiki o ka hoʻomehana / hoʻoluʻu a me ka hoʻomaikaʻi ʻana i ka huahana a me ka pono o ka ikehu. Loaʻa kēia mau lau i nā nui i hiki ke hoʻopili ʻia (kūpono me 100mm a 300mm+ wafers) a hoʻololi i nā hoʻolālā umu like ʻole, e hāʻawi ana i ka hana maʻamau i nā kaʻina semiconductor mua a me hope.
Alumina Vacuum Chuck Introduction
ʻO Al₂O₃ nā pahu pahu he mea koʻikoʻi i ka hana semiconductor, e hāʻawi ana i ke kākoʻo paʻa a pololei i nā kaʻina hana he nui:•Thinning: Hāʻawi i ke kākoʻo like ʻole i ka wā wiwi wafer, e hōʻoia ana i ka hoʻemi kiʻekiʻe o ka substrate no ka hoʻonui ʻana i ka wela chip a me ka hana ʻana o ka mea hana.
• Dicing: Hāʻawi i ka adsorption paʻa i ka wafer dicing, e hōʻemi ana i ka pōʻino a me ka hōʻoia ʻana i nā ʻoki maʻemaʻe no kēlā me kēia pahu.
• Hoʻomaʻemaʻe: ʻO kona laumā, ʻano like ʻole adsorption ʻili e hiki ai ke hoʻopau pono i nā mea haumia me ka ʻole e hōʻino i nā wafers i ka wā hoʻomaʻemaʻe.
•Ka lawe ʻana: Hāʻawi i ke kākoʻo hilinaʻi a paʻa i ka wā o ka lawelawe ʻana a me ka lawe ʻana i ka wafer, e hōʻemi ana i ka pōʻino a me ka haumia.

1.Uniform Micro-Porous Ceramic Technology
• Hoʻohana i nā nano-powders e hana i nā pores i puʻunaue like ʻia a hui pū ʻia, e loaʻa ai ka porosity kiʻekiʻe a me kahi ʻano paʻa like no ke kākoʻo wafer kūpaʻa a hilinaʻi.
2. Nā Pono Mea Kūikawā.
- Hana ʻia mai ka ultra-pure 99.99% alumina (Al₂O₃), hōʻike ia:
• Nā Waiwai Thermal: ʻO ke kūpaʻa wela kiʻekiʻe a me ka conductivity thermal maikaʻi loa, kūpono i nā kaiapuni semiconductor wela kiʻekiʻe.
•Mechanical Properties: ʻO ka ikaika kiʻekiʻe a me ka paʻakikī e hoʻopaʻa i ka lōʻihi, ke kūpaʻa ʻaʻahu, a me ke ola lawelawe lōʻihi.
• Nā Pōmaika'i Hou
3. ʻOi aku ka palahalaha a me ka Parallelism•E hōʻoia i ka pololei a me ka paʻa o ka wafer lawelawe me ka kiʻekiʻe palahalaha a me ka like like, e hoemi ana i ka poino pilikia a me ka hooiaio ana i ka hana ana i nā hualoaʻa. ʻO kāna mau ea permeability maikaʻi a me ka ikaika adsorption like e hoʻonui i ka hilinaʻi hana.
Hoʻohui ka Al₂O₃ vacuum chuck i ka ʻenehana micro-porous holomua, ʻano waiwai waiwai, a me ka pololei kiʻekiʻe e kākoʻo i nā kaʻina semiconductor koʻikoʻi, e hōʻoia i ka pono, hilinaʻi, a me ka hoʻomalu ʻana i ka hoʻopaʻa ʻana ma waena o ka thinning, dicing, hoʻomaʻemaʻe, a me ka lawe ʻana.

Alumina Robot Arm & Alumina Ceramic End Effector pōkole
ʻO nā lima robotic seramika alumina (Al₂O₃) nā mea koʻikoʻi no ka lawelawe ʻana i ka wafer i ka hana semiconductor. Hoʻopili pololei lākou i nā wafers a nona ke kuleana no ka hoʻololi pololei a me ka hoʻonohonoho ʻana i nā wahi koi e like me ka vacuum a i ʻole nā kūlana wela kiʻekiʻe. Aia kā lākou waiwai nui i ka hōʻoia ʻana i ka palekana o ka wafer, ka pale ʻana i ka hoʻohaumia ʻana, a me ka hoʻomaikaʻi ʻana i ka pono o ka hana ʻana o nā mea hana a me ka hoʻohua ʻana ma o nā waiwai waiwai.
| Anana hiʻona | Ka wehewehe kikoʻī |
| Na Waiwai Mechanical | ʻO ka alumina maʻemaʻe kiʻekiʻe (e laʻa,> 99%) hāʻawi i ka paʻakikī kiʻekiʻe (Mohs hardness a hiki i 9) a me ka ikaika flexural (a hiki i 250-500 MPa), e hōʻoiaʻiʻo ana i ka pale ʻana a me ka pale ʻana i ka deformation, a laila e hoʻolōʻihi i ke ola lawelawe.
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| Hoʻolaula uila | ʻO ke kūpaʻa wela o ka lumi a hiki i 10¹⁵ Ω·cm a me ka ikaika insulation o 15 kV/mm e pale pono i ka hoʻokuʻu electrostatic (ESD), pale i nā wafers koʻikoʻi mai ka hoʻopili uila a me ka pōʻino.
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| ʻO ke kūpaʻa wela | Hiki i ka helu heheʻe ke kiʻekiʻe e like me 2050°C hiki ke kū i nā kaʻina hana wela kiʻekiʻe (e laʻa, RTA, CVD) i ka hana semiconductor. ʻO ka hoʻonui haʻahaʻa haʻahaʻa haʻahaʻa e hōʻemi i ka warping a mālama i ka paʻa o ka dimensional ma lalo o ka wela.
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| ʻO ka hoʻomaʻemaʻe kemika | Inert i ka hapa nui o nā waikawa, alkalis, kaʻina kinoea hana, a me nā mea hoʻomaʻemaʻe, e pale ana i ka hoʻohaumia ʻana i nā ʻāpana a i ʻole ka hoʻokuʻu ʻana i nā ion metala. Mālama kēia i kahi kaiapuni hana hoʻomaʻemaʻe ultra-maʻemaʻe a pale i ka hoʻohaumia ʻana i ka ʻili wafer.
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| Nā Pōmaikaʻi ʻē aʻe | Hāʻawi ka ʻenehana hana oʻo i ke kumukūʻai kiʻekiʻe; Hiki ke hoʻomaʻamaʻa pololei ʻia nā ʻili i ka haʻahaʻa haʻahaʻa, e hōʻemi hou ana i nā pilikia o ka hana ʻana.
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Hoʻohana nui ʻia nā lima robotic alumina ceramic i nā kaʻina hana semiconductor mua hope, me:
• Ka lawelawe ʻana a me ka hoʻonoho ʻana i ka Wafer: Hoʻololi a pololei i nā wafers (e laʻa, 100mm a 300mm+ ka nui) i loko o ka ʻea a i ʻole ka hoʻomaʻemaʻe kiʻekiʻe inert kinoea honua, e hōʻemi ana i ka pōʻino a me ka pōʻino.
•Nā Kaʻina Hana Kiʻekiʻe: E like me ka wikiwiki wela (RTA), ka hoʻoheheʻe ʻana o ka mahu (CVD), a me ka etching plasma, kahi e mālama ai i ka paʻa ma lalo o nā wela kiʻekiʻe, e hōʻoia ana i ka paʻa o ka hana a me ka hua.
• Nā Pūnaehana Wafer Handling: Hoʻohui ʻia i loko o nā robots lawelawe wafer ma ke ʻano he hopena hopena e hoʻololi i ka wafer ma waena o nā mea hana, e hoʻonui ai i ka pono hana.
Ka hopena
Hoʻokumu ʻo XKH i ka R&D a me ka hana ʻana i nā ʻāpana seramika silicon carbide (SiC) a me nā alumina (Al₂O₃), me nā lima robotic, nā hoe cantilever, nā pahu pahu, nā waʻa wafer, nā ipu umu, a me nā ʻāpana hana kiʻekiʻe, lawelawe i nā semiconductors, ka ikehu hou, aerospace, a me nā ʻoihana kiʻekiʻe. Hoʻopili mākou i ka hana pololei, ka mana koʻikoʻi, a me ka ʻenehana hou, e hoʻohana ana i nā kaʻina sintering kiʻekiʻe (e laʻa, pressureless sintering, reaction sintering) a me nā ʻenehana mīkini pololei (eg, CNC grinding, polishing) e hōʻoia i ke kūʻokoʻa kiʻekiʻe kiʻekiʻe, ikaika mechanical, inertness kemika, a me ka pololei dimensional. Kākoʻo mākou i ka hana maʻamau e pili ana i nā kaha kiʻi, e hāʻawi ana i nā hoʻonā i hoʻohālikelike ʻia no nā ana, nā ʻano, ka hoʻopau ʻana i ka ʻili, a me nā māka waiwai e hoʻokō i nā koi o ka mea kūʻai aku. Hoʻopaʻa mākou i ka hāʻawi ʻana i nā ʻāpana keramika hilinaʻi a maikaʻi no ka hana kiʻekiʻe kiʻekiʻe o ka honua, hoʻomaikaʻi i ka hana ʻana o nā mea hana a me ka pono hana no kā mākou mea kūʻai.






























