ʻO ka aniani silicon i uhi ʻia me ka ʻili monocrystalline silicon i uhi ʻia me ka ʻili AR anti-reflection
Nā ʻano o ka aniani silicon i uhi ʻia:
1. Hana Optical:
Ka laulā hoʻoili: 1.2-7μm (kokoke i ka infrared a i ka mid-infrared), ka hoʻoili >90% ma ka pūʻulu puka makani 3-5μm (ma hope o ka uhi ʻana).
Ma muli o ke kiʻekiʻe o ka refractive index (n≈ 3.4@4μm), pono e hoʻopili ʻia kahi kiʻiʻoniʻoni anti-reflection (e like me MgF₂/Y₂O₃) e hōʻemi i ka nalowale o ka ʻike ʻana o ka ʻili.
2. Paʻa wela:
ʻO ke koina hoʻonui wela haʻahaʻa (2.6 × 10⁻⁶/K), ke kūpaʻa wela kiʻekiʻe (mahana hana a hiki i 500 ℃), kūpono no nā noi laser mana kiʻekiʻe.
3. Nā waiwai mīkini:
ʻO ka paʻakikī Mohs 7, ke kūpaʻa i ke kahakaha ʻana, akā kiʻekiʻe ka brittleness, pono ka palekana chamfering lihi.
4. Nā ʻano uhi:
Customized anti-reflection film (AR@3-5μm), high reflection film (HR@10.6μm for CO₂ laser), bandpass filter film, etc.
Nā noi aniani silicon i uhi ʻia:
(1) ʻŌnaehana kiʻi wela infrared
Ma ke ʻano he ʻāpana koʻikoʻi o nā aniani infrared (3-5μm a i ʻole 8-12μm band) no ka nānā ʻana i ka palekana, ka nānā ʻana i nā ʻoihana a me nā lako ʻike pō koa.
(2) ʻŌnaehana ʻike laser
Laser CO₂ (10.6μm): Lensa reflector kiʻekiʻe no nā resonators laser a i ʻole ka hoʻokele kukuna.
ʻO ka laser fiber (1.5-2μm): Hoʻomaikaʻi ka aniani kiʻiʻoniʻoni anti-reflection i ka pono o ka hoʻopili ʻana.
(3) Nā lako hoʻāʻo Semiconductor
ʻO ka pahuhopu microscopic infrared no ka ʻike ʻana i nā kīnā wafer, kūpaʻa i ka pala plasma (pono ka pale uhi kūikawā).
(4) nā mea hana loiloi spectral
Ma ke ʻano he ʻāpana spectral o ka spectrometer infrared Fourier (FTIR), pono ka transmittance kiʻekiʻe a me ka distortion wavefront haʻahaʻa.
Nā palena loea:
Ua lilo ka lens silicon monocrystalline i uhi ʻia i mea nui i ka ʻōnaehana optical infrared ma muli o kona hoʻoili kukui infrared maikaʻi loa, ke kūpaʻa wela kiʻekiʻe a me nā ʻano uhi i hiki ke hoʻopilikino ʻia. Hōʻoia kā mākou lawelawe kūikawā i ka hana maikaʻi loa o nā lens i nā noi laser, nānā a me ke kiʻi.
| Kūlana Maʻamau | Kumukūʻai Kiʻekiʻe | |
| Mea Hana | Silika | |
| Ka nui | 5mm-300mm | 5mm-300mm |
| Ka Hoʻomanawanui Nui | ±0.1mm | ±0.02mm |
| Māmā ka puka | ≥90% | 95% |
| Ka maikaʻi o ka ʻili | 60/40 | 20/10 |
| Ke kikowaena | 3' | 1' |
| Ka hoʻomanawanui ʻana i ka lōʻihi o ke kikowaena | ±2% | ±0.5% |
| Uhi ʻana | ʻAʻohe i uhi ʻia, AR, BBAR, Noʻonoʻo | |
Hana maʻamau XKH
Hāʻawi ʻo XKH i ke kaʻina hana hoʻopilikino piha o nā aniani silicon monocrystalline i uhi ʻia: Mai ke koho ʻana i ka substrate silicon monocrystalline (resistivity >1000Ω·cm), ka hana optical precision (spherical/aspherical, surface accuracy λ/4@633nm), ka uhi ʻana maʻamau (anti-reflection/high reflection/filter film, kākoʻo i ka hoʻolālā multi-band), a hiki i ka hoʻāʻo koʻikoʻi (ka helu hoʻoili, ka paepae hōʻino laser, ka hoʻāʻo hilinaʻi kaiapuni), kākoʻo i ka pūʻulu liʻiliʻi (10 ʻāpana) a hiki i ka hana nui. Hāʻawi pū ia i nā palapala loea (nā piʻo uhi, nā palena optical) a me ke kākoʻo ma hope o ke kūʻai aku e hoʻokō i nā koi koi o nā ʻōnaehana optical infrared.





